By J. D. Murray (auth.)

ISBN-10: 0387909370

ISBN-13: 9780387909370

From the reviews: "A strong creation to a subject matter very important for its means to avoid theoretical and functional stumbling blocks, and consequently relatively prized within the functions of arithmetic. The e-book offers a balanced view of the equipment and their usefulness: integrals at the genuine line and within the complicated airplane which come up in several contexts, and suggestions of differential equations no longer expressible as integrals. Murray contains either ancient feedback and references to resources or different extra whole remedies. extra important as a advisor for self-study than as a reference paintings, it's available to any upperclass arithmetic undergraduate. a few routines and a brief bibliography incorporated. inspite of E.T. Copson's Asymptotic Expansions or N.G. de Bruijn's Asymptotic tools in Analysis (1958), any educational library may do good to have this wonderful introduction." (S. Puckette, college of the South) #Choice Sept. 1984#1

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Li, and S. P. Khatri, “Modeling dynamic stability of SRAMs in the presence of single event upsets (SEUs),” in Proc. of the Intl. Symposium on Circuits and Systems, May 2008, pp. 1788–1791. 35. R. Garg, N. Jayakumar, S. P. Khatri, and G. Choi, “A design approach for radiation-hard digital electronics,” in Proc. , July 2006, pp. 773–778. 36. R. Garg and S. P Khatri, “A novel, highly SEU tolerant digital circuit design approach,” in Proc. of the Intl. Conf. on Computer Design, Oct. 2008, pp. 14–20.

The case that is applicable). The derivation of the expression for t2 , for the different cases is as follows: Case 1. Consider the voltage and current waveforms of the 1 inverter during the radiation event as shown in Fig. 3. 3 shows the voltage of node a, IDS currents of M1 and M2, and the radiation-induced current pulse (iseu). As shown in Fig. t/ becomes equal to the IDS of M1, then at that instant, the IDS of M2 is approximately equal to 0 and the voltage at node a is VDD C jVTP j. This is an important observation because this information will be used as the initial condition Fig.

This is done to keep the analysis simple. It was found that neglecting the contribution of M2’s current minimally affect the accuracy of the proposed model. The value of VGM determines the case which is applicable. If Case 4 applies, then the pulse width is 0 since the radiation event does not affect the logic level of INV1. Otherwise, the times t1 and t2 are computed to calculate the pulse width of the voltage glitch at node a. 2 Derivation of the Expression for t1 As shown in the flowchart of the proposed model in Fig.

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Asymptotic Analysis by J. D. Murray (auth.)

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