By P. Ciarlini, M. G. Cox, F. Pavese, G. B. Rossi
ISBN-10: 9812389040
ISBN-13: 9789812389046
This quantity collects refereed contributions in accordance with the shows made on the 6th Workshop on complicated Mathematical and Computational instruments in Metrology, held on the Istituto di Metrologia "G. Colonnetti" (IMGC), Torino, Italy, in September 2003. It presents a discussion board for metrologists, mathematicians and software program engineers that might inspire a more beneficial synthesis of talents, features and assets, and promotes collaboration within the context of european programmes, EUROMET and EA tasks, and MRA requisites. It includes articles by means of a massive, world wide team of metrologists and mathematicians curious about size technological know-how and, including the 5 past volumes during this sequence, constitutes an authoritative resource for the mathematical, statistical and software program instruments essential to smooth metrology.
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Additional resources for Advanced Mathematical and Computational Tools in Metrology VI
Example text
Results are presented for calibration data modelled by straight-line functions. Generalizations are indicated. 1. l. Measurement process N samples, each from a different standard, that consist of the same q gas components, are injected in turn to a gas chromatograph (GC) (figure 1). , helium) supports sample circulation through the column of the GC. During each run, corresponding to the analysis of one standard, the injected gas component molecules are naturally separated. The detector within the GC indicates any deviation from the carrier gas *Work partially funded under EU project SoffoolshletroNet Contract N.
Thus the matrices H and R of the horizontal and diagonal details are not processed, while in the matrices A and V only the columns corresponding to the scratch area will be corrected by using also the not corrupted information in the adjacent columns. The correction of the columns in V is obtained by applying a median filter. In A , the data fitting procedure is complex. The parameters of the scratch, namely the initial column kl and the width w’,are computed from k8, w and the length of the low pass filter, used in the first step.
64' 0 2 4 6 8 10 2 Figure 1. Input and adjusted uncertainties corresponding to procedures B, C, and D and for the 10 measurements of G. physical constants a = ( a ~ a2, , C Z ~ and ) ~ p = (PI, P 2 ) T and nine measurements with associated observation matrix -100 100 5 0 -5 100 -100 0 5 -5 100 0 100 -5 5 100 0 -100 -5 5 C= 0 100 100 5 -5 0 100 -100 5 5 5 0 0 100 100 0 0 -5 100 100 0 5 0 100 -100 The first six (last three) observations contain strong information about a (p). Given y = (aT,/3T)T, we generate exact data according to q = Gy and then simulate measurement data by adding perturbations y = q e according to some model.
Advanced Mathematical and Computational Tools in Metrology VI by P. Ciarlini, M. G. Cox, F. Pavese, G. B. Rossi
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